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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

/ Andrei Pavlov, Manoj Sachdev

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Author

/ Andrei Pavlov, Manoj Sachdev

Publisher

Springer

Edition 1

978-1-4020-8363-1

شناسنامه

Title and Author

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test / / Andrei Pavlov, Manoj Sachdev

Publication Details

: Springer، 2008م

Added Identifiers

نویسنده.

Language

انگلیسی

Cataloger

کانورتور
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