Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2nd Edition
/ Manoj Sachdev, Jose Pineda de Gyvez
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2nd Edition
Author
/ Manoj Sachdev, Jose Pineda de GyvezPublisher
SpringerEdition 1
978-0-387-46547-0
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شناسنامه
Title and Author
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2nd Edition / / Manoj Sachdev, Jose Pineda de GyvezPublication Details
: Springer، 2007مAdded Identifiers
نویسنده.
Language
انگلیسیCataloger
کانورتور