LSI VLSI testability design
/ Frank F. Tsui
LSI VLSI testability design
Author
/ Frank F. TsuiEdition 1
6-100356-07-0
list
شناسنامه
Main Entry
Tsui, Frank F، نویسندهTitle and Author
LSI VLSI testability design / / Frank F. TsuiPublication Details
نیویورک : : McGraw - Hill Book Company، 1987مPhysical Description
xv, 702 p.؛ ; 23 cm؛ : ill..Subject
Integrated CircuitsLarge scale integration
Testing
Integrated Circuits
Vey large scale integration
Testing
series
(Electrical control eingineering seties؛ )Language
انگلیسیRetrieval Number
Congress:
انگليسي.
Includes bibliographical refrences and index.
Includes bibliographical refrences and index.
