Materals reliability issues in microelectronics
Materals reliability issues in microelectronics
Edition 1
1-55899-119-0
list
شناسنامه
Title and Author
Materals reliability issues in microelectronicsPublication Details
پیتسبرگ : : Materials Research Society، 1991مPhysical Description
xiii, [360] p.؛ ; 23 cm؛ : fig..Subject
MicroelectronicsReliability
Congresses
Microelectronics
Materials
Testing
Congresses
Electrodiffusion
Congtesses
Microstructure
Congresses
series
(Material Research Society؛ ; v.225)Added Identifiers
Lloyd, James R، نویسنده .
Ho, Paul S، نویسنده .
Materials Research Society، نویسنده .
MRS Symposium on Materials reliability Issues in Microelectronics(1st: 1991: Anaheim, Calif.)، نویسنده .
Ho, Paul S، نویسنده .
Materials Research Society، نویسنده .
MRS Symposium on Materials reliability Issues in Microelectronics(1st: 1991: Anaheim, Calif.)، نویسنده .
Language
انگلیسیRetrieval Number
Congress:
Notes
انگليسي.Includes bibliographical references and index.
